NanoLog Spectrofluorometer
The instrument consists of
- A Xe lamp source
- 2 detectors for visible and NIR measurements
- Sample compartment
- iHR compartment for the fluorescence imaging
- A controller unit “SpectrAcq”
The instruments is used to measure:
- UV-Vis-NIR steady state emission for solid and liquid sample-measurement range 260-1700 nm
- Direct quantum yield measurement.
- Fluorescent Imaging of nanomaterials such as carbon nanotube etc.
- Fluorescent anisotropy measurements.
